Exploring Combining 3d Tomography With Electron Backscatter Diffraction Ebsd

Exploring Combining 3d Tomography With Electron Backscatter Diffraction Ebsd reveals several interesting facts.

  • Presenter: Hui Yuan, CCEM Link for video sited in webinar: https://youtu.be/G7nXD4RxIIQ.
  • Guest speaker Rick Passey, an expert on Focused Ion Beam Scanning
  • EBSD
  • Speaker: Dr. Ben Britton (UBC Department of Materials Engineering) This talk is part of the Characterization @ UBC seminar ...
  • This is a lecture to introduce

In-Depth Information on Combining 3d Tomography With Electron Backscatter Diffraction Ebsd

Guest speaker Rick Passey, an expert on Focused Ion Beam Scanning Discover how the How While

Material characterization is essential to gain fundamental understanding of the (mechanical) behavior of polycrystalline materials.

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